Steven Hoekstra


Curriculum vitae


[email protected]


office 5613.0405


Van Swinderen Institute

University of Groningen

Feringa Building
Nijenborgh 3, 9747 AG, Groningen



Statistics and systematics of electron EDM searches with BaF


Journal article


A. Boeschoten, V.R. Marshall, T.B. Meijknecht, A.P. Touwen, P. Aggarwal, N. Balasubramanian, R. Bause, H. L. Bethlem, A. Borschevsky, T.H. Fikkers, P.A.B. Haase, Y. Hao, S. Hoekstra, J.W.F. van Hofslot, S.A. Jones, K. Jungmann, J.E.J. Levenga, M.C. Mooij, H. Mulder, B.A. Nijman, E.H. Prinsen, B.J. Schellenberg, I.E. Thompson, R.G.E. Timmermans, L. van Sloten W. Ubachs, J. de Vries, L. Willmann, Y. Yin
ArXiv, 2601.21781, 2026


Cite

Cite

APA   Click to copy
Boeschoten, A., Marshall, V. R., Meijknecht, T. B., Touwen, A. P., Aggarwal, P., Balasubramanian, N., … Yin, Y. (2026). Statistics and systematics of electron EDM searches with BaF. ArXiv, (2601.21781). https://doi.org/10.48550/arXiv.2601.21781


Chicago/Turabian   Click to copy
Boeschoten, A., V.R. Marshall, T.B. Meijknecht, A.P. Touwen, P. Aggarwal, N. Balasubramanian, R. Bause, et al. “Statistics and Systematics of Electron EDM Searches with BaF.” ArXiv, no. 2601.21781 (2026).


MLA   Click to copy
Boeschoten, A., et al. “Statistics and Systematics of Electron EDM Searches with BaF.” ArXiv, no. 2601.21781, 2026, doi:10.48550/arXiv.2601.21781.


BibTeX   Click to copy

@article{a2026a,
  title = {Statistics and systematics of electron EDM searches with BaF},
  year = {2026},
  issue = {2601.21781},
  journal = {ArXiv},
  doi = {10.48550/arXiv.2601.21781},
  author = {Boeschoten, A. and Marshall, V.R. and Meijknecht, T.B. and Touwen, A.P. and Aggarwal, P. and Balasubramanian, N. and Bause, R. and Bethlem, H. L. and Borschevsky, A. and Fikkers, T.H. and Haase, P.A.B. and Hao, Y. and Hoekstra, S. and van Hofslot, J.W.F. and Jones, S.A. and Jungmann, K. and Levenga, J.E.J. and Mooij, M.C. and Mulder, H. and Nijman, B.A. and Prinsen, E.H. and Schellenberg, B.J. and Thompson, I.E. and Timmermans, R.G.E. and L. van Sloten, W. Ubachs and de Vries, J. and Willmann, L. and Yin, Y.}
}


Share

Tools
Translate to